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cai s atomic force microscopy energy research 2022

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Textbook in PDF format Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials―such as lithium-ion batteries, solar cells, and other energy-related materials―are addressed. First book to focus on application of AFM for energy research Details the use of advanced AFM and addresses many types of functional AFM toolsEnables readers to operate an AFM instrument successfully and to understand the data obtained Covers new achievements in AFM instruments, including electrochemical strain microscopy, and how AFM is being combined with other new methods such as infrared (IR) spectroscopy With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics who are working with AFM or planning to use it in their own fields of research, especially energy research. Editor Principles and Basic Modes of Atomic Force Microscopy Working Principles of AFM Contact Mode Tapping Mode PeakForce Tapping Mode Force Measurement and Quantitative Nanoscale Mechanical Measurement Force-Distance Curve PeakForce Quantitative Nanoscale Mechanical Method High-Resolution Imaging of AFM Vertical Resolution Lateral Resolution Atomic and Sub-nanometer Resolution Imaging in Air, Liquid, UHV AFM for Electrical Conductivity Imaging Advanced Modes of Electrostatic and Kelvin Probe Force Microscopy for Energy Applications Electrostatic Force Microscopy Principles of EFM EFM Scanning Modes Quantitative EFM Kelvin Probe Force Microscopy Contact Potential Difference and the Kelvin Method Kelvin Probe Force Microscopy Amplitude and Frequency Modulation Tip Calibration and Environmental Considerations Feedback Artifacts EFM/KPFM Applications for Energy Research Advanced Modes of EFM/KPFM Operation Open-Loop Modes of KPFM Operation Multifrequency and Multidimensional KPFM Three-Dimensional EFM/KPFM Contact and Pulsed Force Techniques Contact Mode Electrostatic Force Microscopy Contact Kelvin Probe Force Microscopy Pulsed Force KPFM Time-Resolved EFM/KPFM Methods Applications at the Solid-Liquid Interface Measuring Electrostatic Forces with SPM at the Solid-Liquid Interface Applications of EFM in Liquid Applications of KPFM in Liquid Conclusions and Future Perspective Piezoresponse Force Microscopy and Electrochemical Strain Microscopy Principle of PFM and ESM Vertical-PFM and ESM Lateral-PFM and Vector-PFM PFM and ESM Spectroscopy Functions of PFM and ESM Electric Field-Strain Coupling Detection Surface Domain Characterization and Manipulation Voltage Spectroscopy Measurement Challenges in PFM and ESM Contact-Mode Operation Electrostatic Force Effect Multi-Signal Sources Spatial Resolution Quantification Advances in PFM and ESM Contact Resonance PFM/ESM Resonance Tracking PFM/ESM Metrological PFM/ESM Dynamic Contact PFM/ESM Heterodyne Megasonic Piezoresponse Force Microscopy Non-Contact Heterodyne Electrostrain Force Microscopy Hybrid AFM Technique: Atomic Force Microscopy-Scanning Electrochemical Microscopy Atomic Force Microscopy-Scanning Electrochemical Microscopy (AFM-SECM) The Principles of AFM-SECM SECM AFM AFM-SECM AFM-SECM Probe AFM-SECM Working Modes Application Areas of AFM-SECM Application in Electrocatalysis Application in Corrosion Research Application in Life Science Perspective Scanning Microwave Impedance Microscopy sMIM Working Principle sMIM Probe Probe Interface Module Microwave Electronics Scanning Platform sMIM Image Mechanism sMIM Operational Modes Direct sMIM Lift Mode sMIM C-V Curve with DC Bias Sweep sMIM dC/dV with AC Bias Modulation sMIM Features Sub-aF Electrical Resolution Nano-Meter Spatial Resolution Linear Response to Dielectric Constant Linear Response to Doping Concentration Subsurface Sensing sMIM Applications at Room Temperature Semiconductors Subsurface Sensing D Materials Ferroelectrics C-V Curve sMIM at Low Temperature Quantum Effect Atomic Force Microscopy-Based Infrared Microscopy for Chemical Nano-Imaging and Spectroscopy Photothermal AFM-IR Microscopy Application of AFM-IR in Energetic Materials Scattering-Type Scanning Near-Field Optical Microscopy Applications of s-SNOM in Energy Materials Summary and Comparison between AFM-IR and IR s-SNOM Application of AFM in Lithium Batteries Research In Situ Visualization of On-site Formation of CEI and SEI in Lithium-ion Batteries Introduction: Interfacial Electrochemistry in Li-ion Batteries In situ AFM Imaging of the Evolution of the CEI Film SEI Live Formation at the Anode/Electrolyte Interfaces in Classical Liquid Electrolytes Regulation Strategies for SEI Films Interfacial Evolution in Lithium-Sulfur Batteries Lithium-Sulfur Batteries: Introduction and Interfacial Electrochemistry Dynamic Evolution at the Cathode/Electrolyte Interfaces in Lithium-Sulfur Batteries Correlating the Catalytic Effect and Interfacial Reactions in Lithium-Oxygen Batteries Interfacial Electrochemistry in Lithium-Oxygen Batteries In Situ AFM Observation of the Electrolyte Effect In Situ AFM Monitoring the Catalytic Effect of Solid Catalysts In Situ AFM Visualization of the Surface Effect of Soluble Catalysts SEI Evolution and Li Plating/Stripping Processes on Li Metal Anode The SEI Film at Lithium Metal Anode/Electrolyte Interface Dynamic Evolution and Artificial Regulation of Li Precipitation Behaviors Dynamic Evolution of the Electrode Processes and Solid Electrolytes in Solid-State Lithium Batteries Cathode Electrolyte Interphase Evolution Structural Deformation and Ion Migration Mechanism of Solid Electrolyte Microscopic Mechanism of the Alloying-Regulated Lithium Precipitation Growth Behavior and Interphasial Property of Lithium Dendrites Summary and Outlook Application of AFM in Solar Cell Research Monocrystalline and Polycrystalline Silicon Solar Cells Amorphous and Polycrystalline Silicon Thin-Film Solar Cells Amorphous Silicon Thin-Film (a-Si) Solar Cells CdTe Thin-Film Solar Cells CIGS Solar Cells Third-Generation Solar Cell Organic Solar Cells Dye-Sensitized Solar Cells Perovskite Solar Cells Outlook Application of AFM for Analyzing the Microstructure of Ferroelectric Polymer as an Energy Material Current Challenge Crystallographic Structure of PVDF and P(VDF-TrFE) Current Challenge in Polar Phase PVDF Fabrication and Phase Content Adjustment AFM-Based Characterization Techniques for Fluoropolymer Application of PFM for Piezoelectric Polymer Combined PFM and KFM Study of the Surface Charge Dynamics in Tribological Nanogenerators Vector PFM Characterization of P (VDF-TrFE) Nanowires In Situ Hot Stage PFM AFM-IR Techniques for Ferroelectric Materials Study Application for Copolymer Films in Low Energy Consumption Ferroelectric Memory Application in Investigating Ferroelectric Polymer Films for Energy Harvester Other New Applications Further Development and Outlook Application of AFM in Microbial Energy Systems Morphology Characterization Microbial Morphologies Size and Morphology of Single Cell Extracellular Appendages and Vesicles Catalysts and Electrode Materials Mechanical Properties Electron Transfer Mechanisms Electrical Conductivity Microbial Cells and Nanowires Inorganic-Microbial Materials Electrochemical Redox Activity Microenvironment of the Biofilm Bioelectrochemistry at the Nanoscale Summary and Future Prospects Practical Guidance of AFM Operations for Energy Research AFM Sample Preparation Common Rules for AFM Sample Preparation Sample Preparation for Different Applications Force Measurement Electrical Measurement AFM-IR Electrochemistry AFM Probe Selection Key Parameters of AFM Probes Optimal Probes for Specified Applications Fast Imaging Low Drift Fluid Imaging Force Measurement Electrical Measurement AFM-IR AFM Artifacts Recognition Common Artifacts in Topography Imaging Artifacts in Force Measurement Artifacts in Electrical Measurement AFM Data Processing Remove Z Offset, Tilt, and Bow Remove Noise

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cai s atomic force microscopy energy research 2022

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